Course Description

Super Resolution Microscopy represents a group of recently developed light microscopic techniques that are able to exceed diffraction-limited resolution (less than 250 nm). This course, which will be presented entirely in virtual format this year, will focus on three main types of Super Resolution Microscopy -- Single Molecule Localization Microscopy (e.g. PALM and STORM), Stimulated Emission Depletion Microscopy (STED), and Structured Illumination Microscopy (SIM). In addition, students will be exposed to other cutting-edge microscopy (e.g. lattice light sheet microscopy, lattice SIM microscopy, and iPALM) developed at the Janelia/HHMI Research Campus through its Advanced Imaging Center (AIC). Furthermore, the course will introduce the Multiview Super-Resolution Microscopy recently developed in Shroff lab of NIH. The course will also cover fluorescent proteins and dyes, as well as the application of deep learning in super resolution imaging.

The course is designed for cell biologists with prior experience in light microscopy who wish to add super resolution microscopy to their research program. Participants will acquire theoretical understanding of super resolution microscopy through lectures given by experts in the field, and practical knowledge through remote Q&A lab sessions on SR microscopes given by microscope vendors.

Lecture Topics
Introduction to Super Resolution Microscopy; Perils and Pitfalls in Super-Resolution Microscopy; Theoretical Background of SIM, PALM/dSTORM, and STED Imaging; Advances in Fluorescent Probes in Super-Resolution imaging; Applications of Super Resolution Microscopy using SIM and dSTORM; Challenges Associated with Obtaining Good SIM, STORM and STED Images; Potential Artifacts Common to Super Resolution Imaging; Lattice Light Sheet Microscopy; Lattice SIM Microscopy; Image Denoising Based on Deep Learning; Multiview Super-Resolution Microscopy.

Laboratory Topics
Imaging specialists from the various microscope manufacturers* will demo their instruments and answer student questions using Zoom. Some of the microscopes that will be showcased include:
Leica Stellaris TauSTED, Abberior STEDCON, Nikon N-STORM, Zeiss Elyra7 Lattice SIM, Zeiss Lattice Sheet 7, and Zeiss LSM 980-AiryScan. In addition, the Shroff Lab at NIH will showcase their Instant SIM and their Dual View Plane Illumination microscope.

*This workshop is purely educational/training. FAES does not endorse any specific company/product; nor do not have any financial agreements/commission from any of the microscope manufacturers.

Although no grades are given for workshops, each participant will receive Continuing Education Units (CEUs) based on the number of contact hours. One CEU is equal to ten contact hours. Upon completion each participant will receive a certificate, showing completion of the workshop and 2.8 CEUs.

Refund Policy

100% tuition refund for registrations cancelled 14 or more calendar days prior to the start of the workshop.

50% tuition refund for registrations cancelled between 4 to 13 calendar days prior to the start of the workshop.

No refund will be issued for registrations cancelled 3 calendar days or less prior to the start of the workshop.

All cancellations must be received in writing via email to Ms. Carline Coote at registrar@faes.org.

Cancellations received after 4:00 pm (ET) on business days or received on non-business days are time marked for the following business day.

All refund payments will be processed by the start of the initial workshop.

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